Nanoscale chemical and structural characterization of transient metallic nanowires using aberration-corrected STEM-EELS

Nano Letters

Volumn 12, Issue 6, 2012, Pages 2732-2739

  Eswara Moorthy, Santhana K ^a,c   Rousseau, Olivier ^b   Viret, Michel ^b   Kociak, Mathieu ^a  

^a UNIVERSITÉ PARIS SUD   (France)

^b SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

^c UNIVERSITY OF ULM   (Germany)

Author keywords

Chemical mapping; nanowires; STEM EELS; transient structures

Indexed keywords

ABERRATION-CORRECTED; BULK ALLOY COMPOSITION; CHEMICAL BEHAVIOR; CHEMICAL MAPPING; HIGH ENERGY; IRON-NICKEL ALLOYS; LOW ENERGIES; MAGNETIC NANOJUNCTIONS; METALLIC NANOWIRES; NANO SCALE; NANOJUNCTIONS; RUPTURE MECHANISM; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPATIAL RESOLUTION; STEM-EELS; STRUCTURAL CHARACTERIZATION; SUBNANOMETERS; TIME-DEPENDENT; TRANSIENT STRUCTURE;

CHARACTERIZATION; ELECTRON ENERGY LOSS SPECTROSCOPY; NICKEL ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

NANOWIRES;

METAL NANOPARTICLE; NANOMATERIAL;

ARTICLE; CHEMISTRY; CONFORMATION; MACROMOLECULE; MAGNETIC FIELD; MATERIALS TESTING; METHODOLOGY; SPECTROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

MACROMOLECULAR SUBSTANCES; MAGNETIC FIELDS; MATERIALS TESTING; METAL NANOPARTICLES; MOLECULAR CONFORMATION; NANOSTRUCTURES; SPECTRUM ANALYSIS; SURFACE PROPERTIES;

EID: 84862278786     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl204374v     Document Type: Article

References (21)

1. Garcia, V. Science 2010, 327, 1106-1110
2. Ohnishi, H.; Kondo, Y.; Takayanagi, K. Nature 1998, 395, 780-783
3. Viret, M.; Berger, S.; Gabureac, M.; Ott, F.; Olligs, D.; Petej, I.; Gregg, J.; Fermon, C.; Francinet, G.; Goff, G. Phys. Rev. B 2002, 66, 220401(R)
4. Kondo, Y.; Takayanagi, K. Phys. Rev. Lett. 1997, 79, 3455-3458
5. Kondo, Y.; Takayanagi, K. Science 2000, 289, 606
6. Rodrigues, V.; Ugarte, D. Phys. Rev. B 2001, 63, 073405
7. Yanson, A. I.; Rubio-Bollinger, G.; van den Brom, H.; Agraït, N.; van Ruitenbeek, J. M. Nature 1998, 395, 783-785
8. Agraït, N.; Levy Yeyati, A.; van Ruitenbeek, J. M. Phys. Reps. 2003, 377, 81-279
9. Svensson, K.; Jompol, Y.; Olin, H.; Olsson, E. Rev. Sci. Instrum. 2003, 74, 4945
10. Bettini, J.; Sato, F.; Coura, P. Z.; Dantas, S. O.; Galvão, D. S.; Ugarte, D. Nat. Nanotechnol. 2006, 1, 182-185
11. Lagos, M. J.; Autreto, P. A. S.; Legoas, S. B.; Sato, F.; Rodrigues, V.; Galvao, D. S.; Ugarte, D. Nanotechnology 2011, 22, 095705
12. Kimoto, K.; Asaka, T.; Nagai, T.; Saito, M.; Matsui, Y.; Ishizuka, K. Nature 2007, 450, 702-704
13. Bosman, M.; Keast, V.; García-Muñoz, J.; D'Alfonso, A.; Findlay, S.; Allen, L. Phys. Rev. Lett. 2007, 99, 086102
14. Muller, D. A.; Kourkoutis, L. F.; Murfitt, M.; Song, J. H.; Hwang, H. Y.; Silcox, J.; Dellby, N.; Krivanek, O. L. Science 2008, 319, 1073-1076
15. Trasobares, S.; López-Haro, M.; Kociak, M.; March, K.; de La Peña, F.; Perez-Omil, J. A.; Calvino, J. J.; Lugg, N. R.; D'Alfonso, A. J.; Allen, L. J.; Colliex, C. Angew. Chem., Int. Ed. 2011, 50, 868-872
16. Ben Hamida, A.; Rousseau, O.; Petit-Watelot, S.; Viret, M. Europhys. Lett. 2011, 94, 27002
17. Egerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope, 3 rd ed.; Springer: New York, 2011.
18. Rodrigues, V.; Sato, F.; Galvao, D. S.; Ugarte, D. Phys. Rev. Lett. 2007, 99, 255501
19. Jeanguillaume, C.; Colliex, C. Ultramicroscopy 1989, 28, 252-257
20. Nion UltraSTEM; NION Inc: Seattle, WA.
21. MSA Software Plug-In; HREM Research, Inc: Higashimastuyama, Japan, 2011.