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Journal of Applied Physics

Volumn 111, Issue 10, 2012, Pages

Improved multiferroic properties in Sm-doped BiFeO 3 thin films deposited using chemical solution deposition method

(5) Singh, S K a,b Tomy, C V c Era, T b Itoh, M b Ishiwara, H b,d

a SOLID STATE PHYSICS LABORATORY (India)

b TOKYO INSTITUTE OF TECHNOLOGY (Japan)

c INDIAN INSTITUTE OF TECHNOLOGY BOMBAY (India)

d Konkuk University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SOLUTION DEPOSITION; CHEMICAL SOLUTION DEPOSITION METHOD; COERCIVE FIELD; MULTIFERROIC PROPERTIES; MULTIFERROICS; PARENT COMPOUNDS; SATURATED MAGNETIZATION; SECONDARY PHASE;

BISMUTH COMPOUNDS; FERROELECTRIC FILMS; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ELECTRIC PROPERTIES;

EID: 84862152712 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4714650 Document Type: Conference Paper

Times cited : (53)

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