PUF-based secure test wrapper design for cryptographic SoC testing

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2012, Pages 866-869

  Das, Amitabh ^a   Kocabaş, Ünal ^b   Sadeghi, Ahmad Reza ^b,c   Verbauwhede, Ingrid ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c FRAUNHOFER INSTITUTE FOR SECURE INFORMATION TECHNOLOGY SIT   (Germany)

Author keywords

Physically Unclonable Functions (PUF); Scan Chains; Secure Test Wrapper; SoC Testing

Indexed keywords

AUTHENTICATION; DIGITAL STORAGE; HARDWARE SECURITY; INTELLECTUAL PROPERTY CORE; PROGRAMMABLE LOGIC CONTROLLERS; SEMICONDUCTOR DEVICE MANUFACTURE; SYSTEM-ON-CHIP; TESTING;

ACTIVATION MECHANISMS; AUTHENTICATION MECHANISMS; PHYSICALLY UNCLONABLE FUNCTIONS; SCAN CHAIN; SEMICONDUCTOR INDUSTRY; SOC TESTING; SYSTEM ON CHIPS (SOC); TEST WRAPPER;

SIDE CHANNEL ATTACK;

EID: 84862090707     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2012.6176618     Document Type: Conference Paper

References (18)

1. th IEEE European Test Symposium 2011 (ETS), 2011.
2. B. Škorić, P. Tuyls, and W. Ophey, "Robust key extraction from physical uncloneable functions applied cryptography and network security," Applied Cryptography and Network Security (ACNS) 2005.
3. D. Lim, J. W. Lee, B. Gassend, E. G. Suh, M. van Dijk, and S. Devadas, "Extracting secret keys from integrated circuits," IEEE Transactions on Very Large Scale Integration (TVLSI), vol. 13, no. 10, pp.1200-1205, Oct. 2005.
4. E. G. Suh and S. Devadas, "Physical unclonable functions for device authentication and secret key generation," ACM/IEEE Design Automation Conference (DAC) 2007.
5. E. Öztürk, G. Hammouri, and B. Sunar, "Towards Robust Low Cost Authentication for Pervasive Devices," International Conference on Pervasive Computing and Communications (PERCOM), Mar. 2008.
6. R. Maes, and I. Verbauwhede, "Physically Unclonable Functions: A Study on the State of the Art and Future Research Directions," In Towards Hardware-Intrinsic Security, Security and Cryptology, D. Naccache, and A. Sadeghi (eds.), Springer, 2010.
7. D. Lim, "Extracting Secret Keys from Integrated Circuits," IEEE Transactions on Very Large Scale Integration (TVLSI) Systems, 2004.
8. U. Rührmair, F. Sehnke, J. Sölter, G. Dror, S. Devadas, and J. Schmidhuber, "Modeling attacks on physical unclonable functions," ACM Conference on Computer and Communications Security (ACM CCS) 2010.
9. B. Gassend, D. Clarke, M. van Dijk, and S. Devadas, "Controlled physical random functions," Computer Security Applications Conference (ACSAC). IEEE, 2002, pp. 149-160.
10. Y. Dodis, L. Reyzin, and A. Smith, "Fuzzy Extractors: How to Generate Strong Keys from Biometrics and other noisy data," EUROCRYPT 2004.
11. B. Yang, K. Wu, and R. Karri, "Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard,"Proceedings of the IEEE Int. Test Conf. (ITC), 2004, pp. 339-344.
12. B.Yang, K. Wu, and R. Karri, "Secure Scan: A Design-for-test Architecture for Crypto Chips," Design Automation Conference (DAC), 2005.
13. D. Hély, M.-L. Flottes, F. Bancel, and B. Rouzeyre, "Scan Design and Secure Chip," International On-Line Testing Symposium (IOLTS), 2004.
14. J. Lee, M. Tehranipoor, C. Patel, and J. Plusquellice, "Securing Designs against Scan-Based Side-Channel Attacks," Transactions on Dependable and Secure Computing, Vol. 4, No. 4, 2007.
15. Y. Shi, N. Togawa, M. Yanagisawa, and T. Ohtsuki, "Design for Secure Test - A Case Study on Pipelined Advanced Encryption Standard," ISCAS, 2007.
16. D. Hély, F. Bancel, M.-L. Flottes, and B. Rouzeyre, "Test Control for Secure Scan Designs," European Test Symposium (ETS), 2005.
17. G. Sengar, D. Mukhopadhayay, and D. R. Chowdhury, "An Efficient Approach to Develop Secure Scan Tree for Crypto-Hardware," International Conference on Advanced Computing and Communications, 2007.
18. Y. Dodis, R. Ostrovsky, L. Reyzin, and A. Smith, "Fuzzy Extractors: How to Generate Strong Keys from Biometrics and Other Noisy Data,"SIAM J. Comput., vol. 38, no. 1, pp. 97-139, 2008.