Influence of annealing temperature on structural, morphological and optical properties of nanostructured TiO 2 thin films

Materials Technology

Volumn 27, Issue 3, 2012, Pages 251-256

  Sonmezoglu S ^a   Cankaya G ^b   Serin, N ^c  

^a KARAMANOGLU MEHMETBEY UNIVERSITY   (Turkey)

^b YILDIRIM BEYAZIT UNIVERSITY   (Turkey)

^c ANKARA UNIVERSITY   (Turkey)

Author keywords

Nanoparticles; Optical properties of thin films; Thin film structure and morphology; X ray diffraction

Indexed keywords

ANNEALING PROCESS; ANNEALING TEMPERATURES; AS-GROWN THIN FILMS; ATOMIC FORCE; CRYSTAL QUALITIES; CRYSTALLINE PHASE; ELECTRICAL AND STRUCTURAL PROPERTIES; GLASS SUBSTRATES; HOLE BLOCKING LAYERS; MATERIAL SURFACE; MICROSTRUCTURAL CHANGES; MORPHOLOGY EVOLUTION; NANOMATERIAL; NANOSTRUCTURED TIO; OPTICAL PARAMETER; OPTICAL PERFORMANCE; OPTICAL PROPERTIES OF THIN FILMS; RESEARCH EFFORTS; ROOM TEMPERATURE; SOL-GEL DIP-COATING METHOD; THERMAL-ANNEALING; THIN FILM STRUCTURE AND MORPHOLOGY; TIO; VISIBLE TRANSMITTANCE;

ATOMIC FORCE MICROSCOPY; COATINGS; ELECTRIC PROPERTIES; NANOPARTICLES; NANOSTRUCTURES; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; SUBSTRATES; THIN FILMS; TITANIUM DIOXIDE; X RAY DIFFRACTION;

ANNEALING;

EID: 84862021057     PISSN: 10667857     EISSN: 17535557     Source Type: Journal    
DOI: 10.1179/1753555712Y.0000000008     Document Type: Article

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