The probe profile and lateral resolution of scanning transmission electron microscopy of thick specimens

Microscopy and Microanalysis

Volumn 18, Issue 3, 2012, Pages 582-590

  Demers, Hendrix ^a   Ramachandra, Ranjan ^b   Drouin, Dominique ^a   De Jonge, Niels ^b,c  

^a UNIVERSITÉ DE SHERBROOKE   (Canada)

^b VANDERBILT UNIVERSITY SCHOOL OF MEDICINE   (United States)

^c INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

Author keywords

electron probe broadening; Monte Carlo simulations; nanoparticles; noise limited resolution; spatial resolution; STEM; thick specimen

Indexed keywords

EID: 84861917289     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612000232     Document Type: Article

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