메뉴 건너뛰기




Volumn 116, Issue 21, 2012, Pages 11682-11693

Structural investigation of α- And β-sodium hexafluoroarsenate, NaAsF 6, by variable temperature x-ray powder diffraction and multinuclear solid-State NMR, and DFT Calculations

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC DISPLACEMENT PARAMETERS; CELL PARAMETER; CHEMICAL SHIELDING TENSORS; CRYSTALLINE STRUCTURE; DENSITY FUNCTIONAL THEORY CALCULATIONS; DFT CALCULATION; ELECTRIC FIELD GRADIENT TENSORS; FULL OPTIMIZATION; GAUGE INCLUDING PROJECTOR AUGMENTED WAVES; HEXAFLUOROARSENATE; J COUPLING; LINEAR CORRELATION; RESCALING; SOLID STATE NMR; STRUCTURAL INVESTIGATION; STRUCTURAL TYPE; VARIABLE TEMPERATURE;

EID: 84861838338     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp3040727     Document Type: Article
Times cited : (25)

References (75)
  • 14
    • 84861832811 scopus 로고    scopus 로고
    • The International Centre for Diffraction Data (ICDD): Newtown Square, PA
    • PDF-4+ Database; The International Centre for Diffraction Data (ICDD): Newtown Square, PA, 2007.
    • (2007) PDF-4+ Database
  • 20
    • 0011205885 scopus 로고    scopus 로고
    • An Augmented Plane Wave + Local Orbitals Program for Calculating Crystal Properties
    • Blaha, P.; Schwarz, K.; Madsen, G. K. H.; Kvasnicka, D.; Luitz, J. WIEN2k, An Augmented Plane Wave + Local Orbitals Program for Calculating Crystal Properties, 2001.
    • (2001) WIEN2k
    • Blaha, P.1    Schwarz, K.2    Madsen, G.K.H.3    Kvasnicka, D.4    Luitz, J.5
  • 54
    • 56149127229 scopus 로고    scopus 로고
    • Pyykko, P. Mol. Phys. 2008, 106, 1965-1974
    • (2008) Mol. Phys. , vol.106 , pp. 1965-1974
    • Pyykko, P.1
  • 55
    • 84864749742 scopus 로고    scopus 로고
    • The integrated intensity of the (101) diffraction peak was determined using the fit profile option of the program or software: version 2.0a; PANanalytical B.V. Almelo, The Netherlands
    • The integrated intensity of the (101) diffraction peak was determined using the fit profile option of the program or software: XPert HighScore Plus, version 2.0a; PANanalytical B.V.: Almelo, The Netherlands, 2004.
    • (2004) XPert HighScore Plus


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.