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Applied Physics Letters

Volumn 100, Issue 20, 2012, Pages

Defects and dc electrical degradation in CaCu 3Ti 4O 12 ceramics: Role of oxygen vacancy migration

(4) Li, Jianying a Zhao, Xuetong a Gu, Fang a Li, Shengtao a

a XI'AN JIAOTONG UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

DC-ELECTRICAL DEGRADATION; DEGRADATION PROCESS; DOMAIN BOUNDARY; GRAIN BOUNDARY RELAXATION; HIGH TEMPERATURE; OXYGEN VACANCY MIGRATION;

CERAMIC MATERIALS; GRAIN BOUNDARIES; OXYGEN VACANCIES;

DEGRADATION;

EID: 84861829882 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4720151 Document Type: Review

Times cited : (61)

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