Patterning of heteroepitaxial overlayers from nano to micron scales

Physical Review Letters

Volumn 108, Issue 22, 2012, Pages

  Elder, K R ^a   Rossi, G ^b   Kanerva, P ^b   Sanches, F ^a   Ying, S C ^c   Granato, E ^c,d   Achim, C V ^b   Ala Nissila, T ^b,c  

^a OAKLAND UNIVERSITY   (United States)

^b AALTO UNIVERSITY   (Finland)

^c BROWN UNIVERSITY   (United States)

^d INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC RESOLUTION; DIFFERENT LENGTH SCALE; EXPERIMENTAL INVESTIGATIONS; HETEROEPITAXIAL; LARGE LENGTH-SCALE; LENGTH SCALE; MICRON SCALE; OVERLAYERS; PATTERN FORMATION; QUANTITATIVE PREDICTION; RU(0001); SELF-ORGANIZED NANOSTRUCTURES; TECHNOLOGICAL APPLICATIONS;

EPITAXIAL GROWTH; ULTRATHIN FILMS;

PALLADIUM;

EID: 84861812337     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.108.226102     Document Type: Article

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