Rutile structured SnO 2 nanowires synthesized with metal catalyst by thermal evaporation method

Journal of Nanoscience and Nanotechnology

Volumn 12, Issue 2, 2012, Pages 1559-1562

  Nam, Sang Hun ^a   Boo, Jin Hyo ^a  

^a Sungkyunkwan University   (South Korea)

Author keywords

Metal catalyst; Nanowires; SnO 2; Thermal evaporation method

Indexed keywords

CATALYTIC LAYERS; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; GAS PARTIAL PRESSURE; GAS SENSING PROPERTIES; GROWTH BEHAVIOR; GROWTH CONDITIONS; IDEAL SYSTEMS; MEAN DIAMETER; METAL CATALYST; NANO-SIZE; NANORODS GROWN; NANOSCALE LEVELS; NANOSCALE SENSORS; OPTICAL AND ELECTRICAL PROPERTIES; POTENTIAL APPLICATIONS; PROCESSING CONDITION; RESEARCH ACTIVITIES; RESEARCH ISSUES; ROOM TEMPERATURE; RUTILE STRUCTURE; SEMICONDUCTING MATERIALS; SILICON (100); SILICON SUBSTRATES; SNO 2; THERMAL EVAPORATION METHOD; THERMAL EVPORATION; TRANSMISSION ELECTRON MICROSCOPY TEM; TRANSPARENT CONDUCTING ELECTRODES; VAPOR-LIQUID-SOLID GROWTH MECHANISM; WIDE BAND GAP; X-RAY DIFFRACTION MEASUREMENTS;

CATALYSTS; ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; GAS DETECTORS; GAS SENSING ELECTRODES; MECHANICAL PROPERTIES; NANOBELTS; NANORODS; NANOTECHNOLOGY; NANOWIRES; OPTOELECTRONIC DEVICES; OXIDE MINERALS; SCANNING ELECTRON MICROSCOPY; SENSORS; THERMAL EVAPORATION; TRANSMISSION ELECTRON MICROSCOPY; VAPORS; X RAY DIFFRACTION;

GOLD;

EID: 84861707936     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2012.4650     Document Type: Conference Paper

References (15)

1. A. M. Morales and C. M. Lieber, Science 279, 208 (1998).
2. Z. W. Pan, Z. R. Dai, and Z. L. Wang, Science 291, 1947 (2001).
3. A. Kolmakov, D. O. Klenov, Y. Lilach, S. Stemmer, and M. Moskovits, Nano Lett. 5, 667 (2005).
4. Z. Q. Liu, D. H. Zhang, S. Han, C. Li, T. Tang, W. Jin, X. L. Liu, B. Lei, and C. W. Zhou, Adv. Mater. 15, 1754 (2003).
5. Y. L. Wang, X. C. Jiang, and Y. N. Xia, J. Am. Chem. Soc. 125, 16176 (2003).
6. H. Huang, O. K. Tan, Y. C. Lee, T. D. Tran, M. S. Tse, and X. Yao, Appl. Phys. Lett. 87, 163123 (2005).
7. M. H. Huang, Y. Wu, H. Feick, N. Tran, E. Weber, and P. Yang, Adv. Mater. 13, 113 (2001).
8. B. D. Yao, Y. F. Chan, and N. Wang, Appl. Phys. Lett. 81, 757 (2002).
9. T. Tao and T. Wang, J. Nanosci. Nanotechnol. 5, 1120 (2005).
10. Y. Chen, X. Cui, K. Zhang, D. Pan, S. Zhang, B. Wang, and J. G. Hou, Chem. Phys. Lett. 369, 16 (2003).
11. Z. R. Dai, J. L. Gole, J. D. Stout, and Z. L. Wang, J. Phys. Chem. B 106, 1274 (2002).
12. X. S. Peng, L. D. Zhang, G. W. Meng, Y. T. Tian, Y. Lin, B. Y. Geng, and S. H. Sun, J. Appl. Phys. 93, 1760 (2003).
13. S. H. Sun, G. W. Menga, M. G. Zhanga, Y. T. Tian, T. Xie, and L. D. Zhang, Sol. Sta. Comm. 128, 287 (2003).
14. E. Comini, G. Faglia, G. Sberveglieri, Z. Pan, and Z. L. Wang, Appl. Phys. Lett. 81, 1869 (2002).
15. S. C. Lyu, Y. Zhang, and C. J. Lee, Chem. Mater. 15, 3294 (2003).