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Volumn 12, Issue 2, 2012, Pages 1658-1661
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Structural characteristics of phosphorus-doped C 60 thin film prepared by radio frequency-plasma assisted thermal evaporation technique
a,b
a
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Author keywords
C60; Lithium batter; Phosphorus; Plasma evaporation; Raman spectroscopy
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Indexed keywords
A-CARBON;
AUGER ANALYSIS;
C60;
COATING LAYER;
DISORDERED CARBON;
DOPANT PRECURSORS;
DOPED FILMS;
ELECTRODE/ELECTROLYTE INTERFACES;
LITHIUM ION SECONDARY BATTERIES;
PHOSPHORUS-DOPED;
PLASMA POWER;
RADIO FREQUENCY PLASMA;
SI ANODES;
SI ELECTRODES;
STRUCTURAL CHARACTERISTICS;
THERMAL EVAPORATION TECHNIQUE;
ARGON;
AUGER ELECTRON SPECTROSCOPY;
CARBON;
CARBON FILMS;
COATINGS;
CYCLIC VOLTAMMETRY;
DOPING (ADDITIVES);
ELECTRODES;
LITHIUM;
PHOSPHORUS;
PHOSPHORUS COMPOUNDS;
PLASMAS;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SILICON;
THERMAL EVAPORATION;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
FILM PREPARATION;
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EID: 84861697784
PISSN: 15334880
EISSN: 15334899
Source Type: Journal
DOI: 10.1166/jnn.2012.4593 Document Type: Conference Paper |
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Times cited : (3)
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References (12)
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