Automated surface inspection of cold-formed micro-parts

CIRP Annals - Manufacturing Technology

Volumn 61, Issue 1, 2012, Pages 531-534

  Scholz Reiter, Bernd ^a   Weimer, Daniel ^a   Thamer, Hendrik ^a  

^a UNIVERSITY OF BREMEN   (Germany)

Author keywords

Defect; Surface analysis; Texture

Indexed keywords

AUTOMATED ANALYSIS SYSTEMS; AUTOMATED DETECTION; COLD FORMING PROCESS; COLD-FORMED; CONFOCAL LASER MICROSCOPY; DATA SETS; DEFECT DETECTION; IMAGE DATA; IN-LINE SURFACES; MASS PRODUCTION; MICRO PART; MICRO-MANUFACTURING; QUALITY INSPECTION; STATISTICAL IMAGE PROCESSING; SURFACE IMPERFECTIONS; SURFACE INSPECTION; TEXTURE ANALYSIS; WORK PIECE SURFACE;

DEFECTS; IMAGE PROCESSING; LUNAR SURFACE ANALYSIS; PRODUCTION ENGINEERING; SURFACE ANALYSIS; TEXTURES;

INSPECTION;

EID: 84861620817     PISSN: 00078506     EISSN: 17260604     Source Type: Journal    
DOI: 10.1016/j.cirp.2012.03.131     Document Type: Article

References (16)

1. Z. Hu Realisation and Application of Size-Dependent FEM-Simulation for Deep Drawing of Rectangular Work Pieces CIRP Journal of Manufacturing Science and Technology 4 2011 90 95
2. F. Vollertsen Categories of Size Effects Production Engineering - Research and Development 2 2008 377 383
3. F. Vollertsen, D. Biermann, H.N. Hansen, I.S. Jawahir, and K. Kuzman Size Effects in Manufacturing of Metallic Components Annals of the CIRP 58 2 2009 566 587
4. B. Tata, and B. Ray Confocal Laser Scanning Microscopy: Applications in Material Science and Technology Material Science 21 1998 263 278
5. W. Jüptner, C. von Kopylow, and C. Falldorf Digital Holography and its Application for Microsystems Inspection Optoelectronics Letters 4 2008 72 77
6. J. You, and S.-W. Kim Optical Inspection of Complex Patterns of Microelectronics Products Annals of the CIRP 57 1 2008 505 508
7. H.N. Hansen, K. Carneiro, H. Haitjema, and L. De Chiffre Dimensional Micro and Nano Technology Annals of the CIRP 55 2 2006 721 734
8. A. Kumar Computer-Vision-Based Fabric Defect Detection: A Survey IEEE Transactions on Industrial Electronics 55 1 2008 348 363
9. X. Xie A Review of Recent Advances in Surface Defect Detection Using Texture Analysis Techniques Electronic Letters on Computer Vision and Image Analysis 7 3 2008 1 22
10. B. Scholz-Reiter, H. Thamer, and M. Lütjen Automated Surface Inspection of Micro Parts IAENG Transactions on Engineering Technologies 5 2010 301 315
11. T. Ojala, M. Pietikäinen, and T. Mäenpää Multiresolution Gray-Scale and Rotation Invariant Texture Classification with Local Binary Patterns IEEE Transactions on Pattern Analysis and Machine Intelligence 24 7 2002 971 987
12. T. Ojala, M. Pietikäinen, and D. Harwook A Comparative Study of Texture Measures with Classification Based on Featured Distributions Pattern Recognition 29 1 1996 51 59
13. F. Vollertsen, and Z. Hu Analysis of Punch Velocity Dependent Process Window in Micro Deep Drawing Production Engineering - Research and Development 4 2010 553 559
14. E.P. Simoncelli, and W.T. Freeman The Steerable Pyramid: A Flexible Architecture for Multi-Scale Derivative Computation International Conference on Image Processing 1995 444 447
15. F. Timm, and E. Barth Non-parametric Texture Defect Detection Using Weibull Features, Image Processing: Machine Vision Applications IV Proceedings of IS&T/SPIE Electronic Imaging, Vol. 7877 2011
16. N.T. Siebel, and G. Sommer Learning Defect Classifiers for Visual Inspection Images by Neuro-evolution Using Weakly Labelled Training Data IEEE World Congress on Computational Intelligence 2008 3925 3931