In situ characterization of structural changes and the fraction of aligned carbon nanotube networks produced by stretching

Carbon

Volumn 50, Issue 10, 2012, Pages 3859-3867

  Li, Shu ^a   Park, Jin Gyu ^a   Liang, Zhiyong ^a   Siegrist, Theo ^b   Liu, Tao ^a   Zhang, Mei ^a   Cheng, Qunfeng ^a   Wang, Ben ^a   Zhang, Chuck ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

^b FAMU FSU COLLEGE OF ENGINEERING   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALIGNED CARBON NANOTUBES; ALIGNED NANOTUBES; BULK PROPERTY MEASUREMENT; CARBON NANOTUBE NETWORK; DENSER PACKINGS; ELECTRICAL ANISOTROPY; IN-SITU CHARACTERIZATION; LONG NANOTUBE; SCATTERING TECHNIQUES; SELF-ASSEMBLING; STRUCTURAL CHANGE; STRUCTURE PROPERTY RELATIONSHIPS;

ALIGNMENT; ELECTRIC PROPERTIES; X RAY DIFFRACTION;

CARBON NANOTUBES;

EID: 84861582230     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2012.04.029     Document Type: Article

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