Self repair in circuits - Automating open fault repair in integrated circuits using field-induced aggregation of carbon nanotubes

IEEE Transactions on Electron Devices

Volumn 59, Issue 6, 2012, Pages 1773-1779

  Sambandan, Sanjiv ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Automation; carbon nanotubes (CNTs); integrated circuit; reliability; repair

Indexed keywords

DIFFUSION LIMITED AGGREGATION; FIELD-INDUCED; INSULATING FLUID; INTERCONNECT FAULTS; OPEN FAULTS; REPAIR MECHANISM; SELF REPAIR;

AGGLOMERATION; AUTOMATION; CARBON NANOTUBES; ELECTRIC FIELDS; INTEGRATED CIRCUITS; RELIABILITY;

REPAIR;

EID: 84861340089     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2012.2191557     Document Type: Article

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