Scanning gate microscopy on a graphene quantum point contact

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 44, Issue 6, 2012, Pages 1002-1004

  Neubeck, S ^a   Ponomarenko, L A ^a   Mayorov, A S ^a   Morozov, S V ^b   Yang, R ^a   Novoselov, K S ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AFM TIP; AMBIENT CONDITIONS; DEVICE STRUCTURES; LOCAL ANODIC OXIDATION; QUANTUM POINT CONTACT; SAMPLE RESISTANCE; SCANNING GATE MICROSCOPY; TWO-DIMENSIONAL MAP;

ANODIC OXIDATION; ELECTRIC FIELDS; GRAPHENE; NANOPROBES; QUANTUM CHEMISTRY;

POINT CONTACTS;

EID: 84861184720     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2010.10.017     Document Type: Article

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