Surface wave sensors based on nanometric layers of strongly absorbing materials

Optics Express

Volumn 20, Issue 9, 2012, Pages 9431-9441

  Zhang, Yichen ^a   Arnold, Christophe ^a   Offermans, Peter ^b   Rivas, Jaime Gómez ^a,c  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b HOLST CENTRE   (Netherlands)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; GLASS; SENSORS; SURFACE WAVES;

ABSORBING MATERIALS; CHALCOGENIDE GLASS; GOLD SURFACES; GUIDED MODES; HIGH SENSITIVITY; NANOMETRICS; REFRACTIVE INDEX SENSOR; RESONANCE WIDTH; SHORT WAVELENGTHS; SURFACE PLASMON POLARITONS; THIN LAYERS;

PHASE CHANGE MEMORY;

CHALCOGEN; GLASS; NANOMATERIAL;

ABSORPTION; ARTICLE; CHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; RADIATION SCATTERING; REFRACTOMETRY; SURFACE PLASMON RESONANCE; TRANSDUCER; ULTRASTRUCTURE;

ABSORPTION; CHALCOGENS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GLASS; LIGHT; NANOSTRUCTURES; REFRACTOMETRY; SCATTERING, RADIATION; SURFACE PLASMON RESONANCE; TRANSDUCERS;

EID: 84861124170     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.009431     Document Type: Article

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