The study of structure and optoelectronic properties of ZnS and ZnO films on porous silicon substrates

Optik

Volumn 123, Issue 12, 2012, Pages 1040-1043

  Wang, Cai Feng ^a   Hu, Bo ^a   Yi, Hou Hui ^a  

^a BINZHOU UNIVERSITY   (China)

Author keywords

I V characteristic; Photoluminescence; White light emission

Indexed keywords

BLUE EMISSION; C-AXIS ORIENTATIONS; CUBIC PHASE; IV CHARACTERISTICS; LUMINESCENCE STUDIES; OPTICAL ABSORPTION MEASUREMENT; OPTICAL AND ELECTRICAL PROPERTIES; OPTOELECTRONIC PROPERTIES; PERFECT MATCHES; POROUS SILICON SUBSTRATES; RED EMISSIONS; REVERSE CURRENTS; ROOM TEMPERATURE; ROOM TEMPERATURE EMISSIONS; VISIBLE PHOTOLUMINESCENCE; WHITE LIGHT EMISSION; ZNO; ZNO FILMS;

ELECTRIC PROPERTIES; HETEROJUNCTIONS; LIGHT EMISSION; METALLIC FILMS; PHOTOLUMINESCENCE; POROUS SILICON; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ZINC SULFIDE;

EID: 84861093244     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijleo.2011.07.027     Document Type: Article

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