Thin-film reliability trends toward improved stability

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 000827-000832

  Jordan, D C ^a   Kurtz, S R ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION RATE; MANUFACTURING DEFECTS; PHOTOVOLTAIC MODULES; POWER GRIDS; PV DEGRADATION; THIN-FILM TECHNOLOGY;

DEGRADATION;

PHOTOVOLTAIC EFFECTS;

EID: 84861088361     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6186081     Document Type: Conference Paper

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