The results of performance measurements of field-aged crystalline silicon photovoltaic modules

Progress in Photovoltaics: Research and Applications

Volumn 17, Issue 4, 2009, Pages 227-240

  Skoczek, Artur ^a   Sample, Tony ^a,b   Dunlop, Ewan D ^a  

^a DG Joint Research Centre Institute for Energy   (Italy)

^b JOINT RESEARCH CENTRE   (Italy)

Author keywords

Long term degradation; Outdoor tests; Qualification tests

Indexed keywords

CATASTROPHIC FAILURES; CRYSTALLINE SILICONS; ELECTRICAL INSULATION; ELECTRICAL PERFORMANCE; ELECTRICAL PERFORMANCE MEASUREMENT; END OF LIVES; GRADUAL DEGRADATION; LIFE-TIME; LONG-TERM DEGRADATION; MAXIMUM POWER; MEASUREMENT UNCERTAINTY; OUTDOOR EXPOSURE; OUTDOOR TESTS; PERFORMANCE MEASUREMENTS; PHOTOVOLTAIC MODULES; QUALIFICATION TESTS; SOLAR MODULE; SUBSTRATE MATERIAL; USEFUL LIFETIME; USER NEED; WARRANTY PERIOD;

CRYSTALLINE MATERIALS; DEGRADATION; ENERGY CONVERSION; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; TESTING; UNCERTAINTY ANALYSIS;

SOLAR ENERGY;

EID: 66149094667     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.874     Document Type: Article

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