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Volumn , Issue , 2011, Pages 003315-003320

Fast Cu(In, Ga)Se 2 formation by processing Cu-In-Ga precursors in selenium atmosphere

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING PROCESS; BEAM LINES; CROSS SECTION; CU(IN , GA)SE; DIFFRACTION SIGNALS; ENERGY DISPERSIVE; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; EXPERIMENTAL SETUP; FILL FACTOR; FLUORESCENCE INTENSITIES; FLUORESCENCE LINES; GASPHASE; HIGH-TIME RESOLUTION; HIGHER TEMPERATURES; IN-PHASE; IN-SITU XRD; LOW BAND GAP; METALLIC DIFFRACTION; METALLIC PHASE; METALLIC PHASIS; METALLIC PRECURSOR; REACTION PATHS; ROOM TEMPERATURE; SELENIDES; SELENIZATION; VACUUM PROCESS; WHITE LIGHT;

EID: 84861064005     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6186649     Document Type: Conference Paper
Times cited : (9)

References (15)
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  • 6
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  • 7
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    • Sulphurisation of gallium-containing thin-film precursors analysed in-situ
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  • 8
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    • F. Hergert, R. Hock, A. Weber, M. Purwins, J. Palm, and V. Probst, "In situ investigation of the formation of Cu(In,Ga)Se2 from selenised metallic precursors by X-ray diffraction - The impact of Gallium, Sodium and Selenium excess," Journal of Physics and Chemistry of Solids, vol. 66, pp. 1903-1907, 2005.
    • (2005) Journal of Physics and Chemistry of Solids , vol.66 , pp. 1903-1907
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  • 11
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  • 12
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.