SCOPUS 정보 검색 플랫폼

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 003237-003240

Non-destructive testing of crystalline silicon photovoltaic back-contact modules

(4) Veldman, D a Bennett, I J a Brockholz, B a De Jong, P C a

a TNO (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CELL HANDLING; CONDUCTIVE ADHESIVE; CRYSTALLINE SILICONS; ELECTRICAL INTERCONNECTIONS; FORWARD BIAS; INTEGRATED MODULE; LOCKIN THERMOGRAPHY; LOW TEMPERATURES; NON DESTRUCTIVE TESTING; NON-DESTRUCTIVE TEST METHODS; PHOTOVOLTAIC MODULES; PICK-AND-PLACE; TEST METHOD; ULTRASONIC INSPECTIONS; X RAY SCANNING;

CELLS; CYTOLOGY; INSPECTION; PHOTOVOLTAIC EFFECTS; THERMOGRAPHY (TEMPERATURE MEASUREMENT); ULTRASONIC TESTING;

NONDESTRUCTIVE EXAMINATION;

EID: 84861024931 PISSN: 01608371 EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2011.6186628 Document Type: Conference Paper

Times cited : (9)

References (7)

1
- 27944476677
- Single-step laminated full-size PV modules made with back-contacted mc-Si cells and conductive adhesives
- P. C. de Jong, D. W. K. Eikelboom, R. Kinderman, A. C. Tip, J. H. Bultman, M. H. H. Meuwissen, and M. A. C. J. van den Nieuwenhof, "Single-step laminated full-size PV modules made with back-contacted mc-Si cells and conductive adhesives", 19th EPVSEC, 2004, pp. 2145-2149.
- (2004) 19th EPVSEC , pp. 2145-2149
- De Jong, P.C.¹ Eikelboom, D.W.K.² Kinderman, R.³ Tip, A.C.⁴ Bultman, J.H.⁵ Meuwissen, M.H.H.⁶ Van Den Nieuwenhof, M.A.C.J.⁷

2
- 84879725027
- Busbarless emitter wrap-through solar cells and modules
- P. Hacke, B. Murphy, D. Meakin, J. Dominguez, J. Jaramillo, M. Yamasaki, and J. Gee, "Busbarless emitter wrap-through solar cells and modules", 33rd IEEE PVSC, 2008, pp. 1-5.
- (2008) 33rd IEEE PVSC , pp. 1-5
- Hacke, P.¹ Murphy, B.² Meakin, D.³ Dominguez, J.⁴ Jaramillo, J.⁵ Yamasaki, M.⁶ Gee, J.⁷

3
- 79955054268
- Analysis of PV modules by electroluminescence and IR thermography
- U. Hoyer, A. Burkert, R. Auer, C. Buerhop, C. Vodermayer, M. Mayer, and G. Wotruba, "Analysis of PV modules by electroluminescence and IR thermography", 24th EPVSEC, 2009, pp. 3262-3266.
- (2009) 24th EPVSEC , pp. 3262-3266
- Hoyer, U.¹ Burkert, A.² Auer, R.³ Buerhop, C.⁴ Vodermayer, C.⁵ Mayer, M.⁶ Wotruba, G.⁷

4
- 77951529054
- Exploring diagnostic capabilities for application to new photovoltaic technologies
- E. C. Quintana, M. A. Quintana, K. D. Rolfe, K. R. Thompson, and P. Hacke, "Exploring diagnostic capabilities for application to new photovoltaic technologies", 34th IEEE PVSC, 2009, pp. 2031-2036.
- (2009) 34th IEEE PVSC , pp. 2031-2036
- Quintana, E.C.¹ Quintana, M.A.² Rolfe, K.D.³ Thompson, K.R.⁴ Hacke, P.⁵

5
- 1342345656
- Springer, Berlin
- O. Breitenstein, and M. Langenkamp, "Lock-in Thermography" (Springer, Berlin, 2003).
- (2003) Lock-in Thermography
- Breitenstein, O.¹ Langenkamp, M.²

6
- 56749176472
- Imaging physical parameters of pre-breakdown sites by lock-in thermography techniques
- O. Breitenstein, J. Bauer, J.-M. Wagner, and A. Lotnyk, "Imaging physical parameters of pre-breakdown sites by lock-in thermography techniques", Prog. Photovolt.: Res. Appl. 16, 2008, pp. 679-685.
- (2008) Prog. Photovolt.: Res. Appl. , vol.16 , pp. 679-685
- Breitenstein, O.¹ Bauer, J.² Wagner, J.-M.³ Lotnyk, A.⁴

7
- 70349559476
- Reliable hot-spot classification in 10 ms using ultra-fast lock-in thermography
- M. Kasemann, B. Walter, W. Warta, "Reliable hot-spot classification in 10 ms using ultra-fast lock-in thermography", Prog. Photovolt.: Res. Appl. 17, 2009, pp. 441-450.
- (2009) Prog. Photovolt.: Res. Appl. , vol.17 , pp. 441-450
- Kasemann, M.¹ Walter, B.² Warta, W.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.