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Volumn , Issue , 2011, Pages 530-535
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Experimental investigation of microgap cooling technology for minimizing temperature gradient and mitigating hotspots in electronic devices
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AVERAGE VALUES;
COOLING TECHNOLOGY;
ELECTRONIC DEVICE;
EXPERIMENTAL INVESTIGATIONS;
FLUX CONDITIONS;
HEATED SURFACES;
HIGH-PERFORMANCE COMPUTING TECHNOLOGY;
HOT SPOT;
HOTSPOTS;
LOCAL HEAT;
MAXIMUM TEMPERATURE;
MICRO GAPS;
MILITARY SYSTEMS;
PACKAGING DENSITY;
PEAK TEMPERATURES;
SILICON-BASED;
THIN FILM EVAPORATION;
TWO PHASE;
WALL TEMPERATURES;
CHIP SCALE PACKAGES;
COOLING;
HEAT FLUX;
PHASE TRANSITIONS;
THERMAL GRADIENTS;
THERMOELECTRIC EQUIPMENT;
TECHNOLOGY;
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EID: 84860894303
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EPTC.2011.6184478 Document Type: Conference Paper |
Times cited : (15)
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References (6)
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