High reliable In-Ga-Zn-oxide FET based electronic global shutter sensors for in-cell optical touch screens and image sensors

49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011

Volumn 2, Issue , 2011, Pages 729-732

  Tamura, Hikaru ^a   Hamada, Toshiki ^a   Nakagawa, Takashi ^a   Aoki, Takeshi ^a   Ikeda, Masataka ^a   Kozuma, Munehiro ^a   Kurokawa, Yoshiyuki ^a   Ikeda, Takayuki ^a   Moriya, Koji ^a   Hirakata, Yoshiharu ^a   Kamata, Nozomi ^a   Murakawa, Tsutomu ^a   Koyama, Jun ^a   Yamazaki, Shunpei ^a   Tochibayashi, Katsuaki ^a   Okazaki, Kenichi ^a   Sakakura, Masayuki ^a  

^a SEMICONDUCTOR ENERGY LABORATORY CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RELIABLE; NOVEL APPLICATIONS; OFF-STATE CURRENT; OXIDE SEMICONDUCTOR;

EXHIBITIONS; IMAGE SENSORS; TOUCH SCREENS;

LIQUID CRYSTAL DISPLAYS;

EID: 84860859738     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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