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European Physical Journal Plus

Volumn 126, Issue 12, 2011, Pages 1-11

Spatially calibrated elemental depth profiling using LIPS and 3D digital microscopy

(4) Siano, S a Cacciari, I a Mencaglia, A a Agresti, J a

a IFAC CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84860812271 PISSN: None EISSN: 21905444 Source Type: Journal
DOI: 10.1140/epjp/i2011-11120-y Document Type: Article

Times cited : (14)

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