메뉴 건너뛰기




Volumn 65, Issue 3, 2010, Pages 210-217

Numerical and experimental depth profile analyses of coated and attached layers by laser-induced breakdown spectroscopy

Author keywords

Coating thickness; Depth profiling; Depth resolution; Laser ablation modeling; Laser induced breakdown spectroscopy (LIBS)

Indexed keywords

1064 NM; ABLATION RATES; ALUMINUM SUBSTRATE; AMBIENT AIR; COATING THICKNESS; COPPER FOILS; CORRELATION COEFFICIENT; DEPTH PROFILE; DEPTH RESOLUTION; DEPTH-PROFILE ANALYSIS; INTERFACE POSITION; INTERFACIAL EFFECTS; LAYER THICKNESS; MULTI-PULSE LASER; ND : YAG LASERS; PULSE DURATIONS; SIMULATION RESULT; THREE-DIMENSIONAL MODEL; TWO DIFFERENT WAVELENGTHS;

EID: 77951090610     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2010.02.005     Document Type: Article
Times cited : (15)

References (35)
  • 1
    • 17544385692 scopus 로고    scopus 로고
    • Effects of surface structure on depth resolution of AES depth profiles of Ni/Cr multilayers
    • Zalar A., Pracek B., and Panjan P. Effects of surface structure on depth resolution of AES depth profiles of Ni/Cr multilayers. Surf. Interface Anal. 30 (2000) 247-250
    • (2000) Surf. Interface Anal. , vol.30 , pp. 247-250
    • Zalar, A.1    Pracek, B.2    Panjan, P.3
  • 2
    • 0032632536 scopus 로고    scopus 로고
    • Optimization of depth resolution parameters in AES sputter profiling of GaAs/AlAs multilayer structures
    • Rar A., Hofmann S., Yoshihara K., and Kajiwara K. Optimization of depth resolution parameters in AES sputter profiling of GaAs/AlAs multilayer structures. Appl. Surf. Sci. 144-145 (1999) 310-314
    • (1999) Appl. Surf. Sci. , vol.144-145 , pp. 310-314
    • Rar, A.1    Hofmann, S.2    Yoshihara, K.3    Kajiwara, K.4
  • 5
    • 0034245329 scopus 로고    scopus 로고
    • Ultimate depth resolution and profile reconstruction in sputter profiling with AES and SIMS
    • Hofmann S. Ultimate depth resolution and profile reconstruction in sputter profiling with AES and SIMS. Surf. Interface Anal. 30 (2000) 228-236
    • (2000) Surf. Interface Anal. , vol.30 , pp. 228-236
    • Hofmann, S.1
  • 6
    • 0037415869 scopus 로고    scopus 로고
    • Comparison of depth profiling techniques using ion sputtering from the practical point of view
    • Oswald S., and Baunack S. Comparison of depth profiling techniques using ion sputtering from the practical point of view. Thin Solid Films 425 (2003) 9-19
    • (2003) Thin Solid Films , vol.425 , pp. 9-19
    • Oswald, S.1    Baunack, S.2
  • 7
    • 37049088340 scopus 로고
    • Surface analysis with the glow discharge lamp. State of the art and prospects for future development
    • Bengtson A., and Lundholm M. Surface analysis with the glow discharge lamp. State of the art and prospects for future development. J. Anal. At. Spectrom. 3 (1988) 879-882
    • (1988) J. Anal. At. Spectrom. , vol.3 , pp. 879-882
    • Bengtson, A.1    Lundholm, M.2
  • 8
    • 0000262846 scopus 로고
    • Application of glow discharge mass spectrometry with low mass resolution for in-depth analysis of technical surface layers
    • Jakubowski N., and Stuewer D. Application of glow discharge mass spectrometry with low mass resolution for in-depth analysis of technical surface layers. J. Anal. At. Spectrom. 7 (1992) 951-958
    • (1992) J. Anal. At. Spectrom. , vol.7 , pp. 951-958
    • Jakubowski, N.1    Stuewer, D.2
  • 9
    • 0030245519 scopus 로고    scopus 로고
    • Developments in glow discharge optical emission spectrometry. Invited lecture
    • Bengtson A. Developments in glow discharge optical emission spectrometry. Invited lecture. J. Anal. At. Spectrom. 11 (1996) 829-833
    • (1996) J. Anal. At. Spectrom. , vol.11 , pp. 829-833
    • Bengtson, A.1
  • 10
    • 0034269342 scopus 로고    scopus 로고
    • Quantitative depth analysis using microsecond pulsed glow discharge atomic emission spectrometry
    • Oxley E., Yang C., and Harrison W.W. Quantitative depth analysis using microsecond pulsed glow discharge atomic emission spectrometry. J. Anal. At. Spectrom. 15 (2000) 1241-1245
    • (2000) J. Anal. At. Spectrom. , vol.15 , pp. 1241-1245
    • Oxley, E.1    Yang, C.2    Harrison, W.W.3
  • 11
    • 0031206799 scopus 로고    scopus 로고
    • Depth-resolved analysis of multilayered samples by laser-induced breakdown spectrometry
    • Vadillo J.M., and Laserna J.J. Depth-resolved analysis of multilayered samples by laser-induced breakdown spectrometry. J. Anal. At. Spectrom. 12 (1997) 859-862
    • (1997) J. Anal. At. Spectrom. , vol.12 , pp. 859-862
    • Vadillo, J.M.1    Laserna, J.J.2
  • 13
    • 25444516880 scopus 로고    scopus 로고
    • Online coating thickness measurement and depth profiling of zinc coated sheet steel by laser-induced breakdown spectroscopy, and R. Noll
    • Balzer H., Hoehne M., Sturm V., and Noll R. Online coating thickness measurement and depth profiling of zinc coated sheet steel by laser-induced breakdown spectroscopy, and R. Noll. Spectrochim. Acta Part B 60 (2005) 1172-1178
    • (2005) Spectrochim. Acta Part B , vol.60 , pp. 1172-1178
    • Balzer, H.1    Hoehne, M.2    Sturm, V.3    Noll, R.4
  • 14
    • 33646387742 scopus 로고    scopus 로고
    • Systematic line selection for online coating thickness measurements of galvanised sheet steel using LIBS
    • Balzer H., Hölters S., Sturm V., and Noll R. Systematic line selection for online coating thickness measurements of galvanised sheet steel using LIBS. Anal. Bioanal. Chem. 385 (2006) 234-239
    • (2006) Anal. Bioanal. Chem. , vol.385 , pp. 234-239
    • Balzer, H.1    Hölters, S.2    Sturm, V.3    Noll, R.4
  • 15
    • 33646415103 scopus 로고    scopus 로고
    • New approach to online monitoring of the Al depth profile of the hot-dip galvanised sheet steel using LIBS
    • Balzer H., Hoehne M., Noll R., and Sturm V. New approach to online monitoring of the Al depth profile of the hot-dip galvanised sheet steel using LIBS. Anal. Bioanal. Chem. 385 (2006) 225-233
    • (2006) Anal. Bioanal. Chem. , vol.385 , pp. 225-233
    • Balzer, H.1    Hoehne, M.2    Noll, R.3    Sturm, V.4
  • 16
    • 0036605679 scopus 로고    scopus 로고
    • Rapid at-line analysis of coating thickness and uniformity on tablets using laser induced breakdown spectroscopy
    • Mowery M.D., Sing R., Kirsch J., Razaghi A., Bechard S., and Reed R.A. Rapid at-line analysis of coating thickness and uniformity on tablets using laser induced breakdown spectroscopy. J. Pharm. Biomed. Anal. 28 (2002) 935-943
    • (2002) J. Pharm. Biomed. Anal. , vol.28 , pp. 935-943
    • Mowery, M.D.1    Sing, R.2    Kirsch, J.3    Razaghi, A.4    Bechard, S.5    Reed, R.A.6
  • 17
    • 22544452399 scopus 로고    scopus 로고
    • Depth profile analysis of copper coating on steel using laser ablation inductively coupled plasma mass spectrometry
    • Coedo A.G., Dorado T., Padilla I., and Fariñas J.C. Depth profile analysis of copper coating on steel using laser ablation inductively coupled plasma mass spectrometry. J. Anal. At. Spectrom. 20 (2005) 612-620
    • (2005) J. Anal. At. Spectrom. , vol.20 , pp. 612-620
    • Coedo, A.G.1    Dorado, T.2    Padilla, I.3    Fariñas, J.C.4
  • 18
    • 0034740365 scopus 로고    scopus 로고
    • Irradiance-dependent depth profiling of layered materials using laser-induced plasma spectrometry
    • Mateo M.P., Vadillo J.M., and Laserna J.J. Irradiance-dependent depth profiling of layered materials using laser-induced plasma spectrometry. J. Anal. At. Spectrom. 16 (2001) 1317-1321
    • (2001) J. Anal. At. Spectrom. , vol.16 , pp. 1317-1321
    • Mateo, M.P.1    Vadillo, J.M.2    Laserna, J.J.3
  • 19
    • 0000569154 scopus 로고
    • Depth profile studies using laser-induced plasma emission spectrometry
    • Anderson D.R., McLeod C.W., English T., and Smith A.T. Depth profile studies using laser-induced plasma emission spectrometry. Appl. Spectrosc. 49 (1995) 691-701
    • (1995) Appl. Spectrosc. , vol.49 , pp. 691-701
    • Anderson, D.R.1    McLeod, C.W.2    English, T.3    Smith, A.T.4
  • 22
    • 0242366229 scopus 로고    scopus 로고
    • Line-focused laser ablation for depth-profiling analysis of coated and layered materials
    • Mateo M.P., Cabalín L.M., and Laserna J.J. Line-focused laser ablation for depth-profiling analysis of coated and layered materials. Appl. Opt. 42 (2003) 6057-6062
    • (2003) Appl. Opt. , vol.42 , pp. 6057-6062
    • Mateo, M.P.1    Cabalín, L.M.2    Laserna, J.J.3
  • 23
    • 0032141332 scopus 로고    scopus 로고
    • Nanometric range depth-resolved analysis of coated-steels using laser-induced breakdown spectrometry with a 308 nm collimated beam
    • Vadillo J.M., García C.C., Pulanco S., and Laserna J.J. Nanometric range depth-resolved analysis of coated-steels using laser-induced breakdown spectrometry with a 308 nm collimated beam. J. Anal. At. Spectrom. 13 (1998) 793-797
    • (1998) J. Anal. At. Spectrom. , vol.13 , pp. 793-797
    • Vadillo, J.M.1    García, C.C.2    Pulanco, S.3    Laserna, J.J.4
  • 24
    • 0034224159 scopus 로고    scopus 로고
    • Angle-resolved laser-induced breakdown spectrometry for depth profiling of coated materials
    • García C.C., Corral M., Vadillo J.M., and Laserna J.J. Angle-resolved laser-induced breakdown spectrometry for depth profiling of coated materials. Appl. Spectrosc. 54 (2000) 1027-1031
    • (2000) Appl. Spectrosc. , vol.54 , pp. 1027-1031
    • García, C.C.1    Corral, M.2    Vadillo, J.M.3    Laserna, J.J.4
  • 26
    • 0034896882 scopus 로고    scopus 로고
    • Pulsed laser ablation of solids: transition from normal vaporization to phase explosion
    • Bulgakova N.M., and Bulgakov A.V. Pulsed laser ablation of solids: transition from normal vaporization to phase explosion. Appl. Phys. A 73 (2001) 199-208
    • (2001) Appl. Phys. A , vol.73 , pp. 199-208
    • Bulgakova, N.M.1    Bulgakov, A.V.2
  • 28
    • 33646093465 scopus 로고    scopus 로고
    • Effect of the dielectric transition on laser-induced phase explosion in metals
    • Porneala C., and Willis D.A. Effect of the dielectric transition on laser-induced phase explosion in metals. Int. J. Heat Mass Transfer 49 (2006) 1928-1936
    • (2006) Int. J. Heat Mass Transfer , vol.49 , pp. 1928-1936
    • Porneala, C.1    Willis, D.A.2
  • 31
    • 0344552482 scopus 로고    scopus 로고
    • Laser ablation for analytical sampling: what can we learn from modeling?
    • Bogaerts A., Chen Z., Gijbels R., and Vertes A. Laser ablation for analytical sampling: what can we learn from modeling?. Spectrochim. Acta Part B 58 (2003) 1867-1893
    • (2003) Spectrochim. Acta Part B , vol.58 , pp. 1867-1893
    • Bogaerts, A.1    Chen, Z.2    Gijbels, R.3    Vertes, A.4
  • 32
    • 66549084466 scopus 로고    scopus 로고
    • Laser ablation of aluminum from normal evaporation to phase explosion
    • Gragossian A., Tavassoli S.H., and Shokri B. Laser ablation of aluminum from normal evaporation to phase explosion. J. Appl. Phys. 105 (2009) 103304.1-103304.7
    • (2009) J. Appl. Phys. , vol.105
    • Gragossian, A.1    Tavassoli, S.H.2    Shokri, B.3
  • 34
    • 33845334532 scopus 로고    scopus 로고
    • Material ablation and plasma state for single and collinear double pulses interacting with iron samples at ambient gas pressures below 1 bar
    • Peter L., and Noll R. Material ablation and plasma state for single and collinear double pulses interacting with iron samples at ambient gas pressures below 1 bar. Appl. Phys. B 86 (2007) 159-167
    • (2007) Appl. Phys. B , vol.86 , pp. 159-167
    • Peter, L.1    Noll, R.2
  • 35
    • 0037342757 scopus 로고    scopus 로고
    • High-aspect-ratio microdrilling of polymers with UV laser ablation: experiment with analytical model
    • Tokarev V.N., Lopez J., Lazare S., and Weisbuch F. High-aspect-ratio microdrilling of polymers with UV laser ablation: experiment with analytical model. Appl. Phys. A 76 (2003) 385-396
    • (2003) Appl. Phys. A , vol.76 , pp. 385-396
    • Tokarev, V.N.1    Lopez, J.2    Lazare, S.3    Weisbuch, F.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.