Comparative analysis of layered materials using laser-induced plasma spectrometry and laser-ionization time-of-flight mass spectrometry

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 56, Issue 6, 2001, Pages 923-931

  Garcia, C C ^a   Vadillo, J M ^a   Palanco, S ^a   Ruiz, J ^a   Laserna, J J ^a  

^a UNIVERSITY OF MÁLAGA   (Spain)

Author keywords

Depth resolved analysis; Layered materials; LIPS; Time of flight mass spectrometry

Indexed keywords

COATING TECHNIQUES; LASER BEAM EFFECTS; PHOTOIONIZATION; PLASMA APPLICATIONS; STEEL ANALYSIS; SURFACE TREATMENT;

LASER IONIZATION TIME-OF-FLIGHT MASS SPECTROMETRY; LASER-INDUCED PLASMA SPECTROMETRY;

MASS SPECTROMETRY;

EID: 0035967723     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(01)00196-3     Document Type: Article

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