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Applied Physics Letters

Volumn 99, Issue 6, 2011, Pages

Microfocus infrared ellipsometry characterization of air-exposed graphene flakes

(5) Weber, J W a Hinrichs, K b Gensch, M c Van De Sanden, M C M a Oates, T W H b

a EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

b LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V (Germany)

c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL EFFECTS; DIELECTRIC FUNCTIONS; ENVIRONMENTAL EXPOSURE; GRAPHITE FLAKES; IMAGINARY PARTS; INFRARED ELLIPSOMETRY; INTRABAND TRANSITIONS; OPTICAL MODELS; REAL-WORLD APPLICATION; ULTRA-THIN;

ELLIPSOMETRY; GRAPHITE;

GRAPHENE;

EID: 84860400052 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3624826 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.