Mechanical break junctions: Enormous information in a nanoscale package

ACS Nano

Volumn 6, Issue 4, 2012, Pages 2871-2876

  Natelson, Douglas ^a  

^a RICE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC APPROACH; BREAK JUNCTIONS; ELECTRONIC CONDUCTION; ELECTRONIC DEVICE; ELECTRONIC TRANSPORT; EXPERIMENTAL DATA; METAL FILM; METAL TIP; MOLECULAR SCALE; NANO SCALE; OPTICAL RESPONSE; TWO-DIMENSIONAL ANALYSIS;

ENGINEERING; NANOTECHNOLOGY;

PHYSICS;

EID: 84860356197     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn301323u     Document Type: Review

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