Space-charge effects in ultrafast electron diffraction patterns from single crystals

Ultramicroscopy

Volumn 116, Issue , 2012, Pages 86-94

  Chatelain, Robert P ^a   Morrison, Vance ^a   Godbout, Chris ^a   van der Geer, Bas ^b   de Loos, Marieke ^b   Siwick, Bradley J ^a  

^a MCGILL UNIVERSITY   (Canada)

^b Pulsar Physics   (Netherlands)

Author keywords

Dynamic transmission electron microscopy; Space charge effects; Ultrafast electron diffraction; Ultrafast electron microscopy

Indexed keywords

BEAM BRIGHTNESS; BEAM ENERGIES; BEAM ILLUMINATION; BEAMLETS; BRAGG SPOTS; DYNAMIC TRANSMISSION ELECTRON MICROSCOPIES; ENERGY SPREADS; FOCUSING CONDITIONS; POST PROCESSING; PRIMARY MECHANISM; RELATIVISTIC BEAMS; SPACE CHARGE EFFECTS; SPECIMEN THICKNESS; ULTRAFAST ELECTRON DIFFRACTION; ULTRAFAST ELECTRON MICROSCOPY;

DIFFRACTION PATTERNS; ELECTRON BEAMS; ELECTRON-ELECTRON INTERACTIONS; INTERFEROMETRY; LUMINANCE; OPTICAL DESIGN; TRANSMISSION ELECTRON MICROSCOPY;

SINGLE CRYSTALS;

ANALYTIC METHOD; ARTICLE; ELECTRON BEAM; ELECTRON DIFFRACTION; ILLUMINATION; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; SIMULATION; STATIC ELECTRICITY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84860290516     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.03.001     Document Type: Article

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