Potassium-silicate glass exposed to low energy H + beam

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 280, Issue , 2012, Pages 111-116

  Gedeon, Ondrej ^a   Zemek, Josef ^b   Jiricek, Petr ^b  

^a INSTITUTE OF CHEMICAL TECHNOLOGY   (Czech Republic)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Potassium silicate glass; Proton irradiation; Surface relaxation; XPS

Indexed keywords

ATOMIC CONCENTRATION; BINARY POTASSIUM SILICATE; BRIDGING OXYGEN; GLASS SURFACES; IN-VACUUM; LOW ENERGIES; NON-BRIDGING OXYGEN; POTASSIUM-SILICATE GLASS; PRISTINE SURFACES; PROTON BOMBARDMENT; SURFACE LAYERS;

OXYGEN; POTASSIUM; PROTON IRRADIATION; SILICATES; SILICON OXIDES; SURFACE RELAXATION; X RAY PHOTOELECTRON SPECTROSCOPY;

GLASS;

EID: 84860270651     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2012.03.018     Document Type: Article

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