Ultrathin section preparation of phyllosilicates by Focused Ion Beam milling for quantitative analysis by TEM-EDX

Applied Clay Science

Volumn 59-60, Issue , 2012, Pages 121-130

  Bourdelle, Franck ^a,d   Parra, Teddy ^b   Beyssac, Olivier ^c   Chopin, Christian ^d   Moreau, Florent ^b  

^a UNIVERSITÉ DE CERGY PONTOISE   (France)

^b IFP ENERGIES NOUVELLES   (France)

^c UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^d ECOLE NORMALE SUPÉRIEURE   (France)

Author keywords

Analytical protocol; Analytical TEM; Focused Ion Beam (FIB); Phyllosilicate; Sample preparation

Indexed keywords

ANALYTICAL PROCEDURE; ANALYTICAL PROTOCOLS; ANALYTICAL TEM; BEAM DAMAGE; CHEMICAL ZONING; CLAY PARTICLES; EMP ANALYSIS; FOCUSED ION BEAM MILLING; GEOLOGICAL HISTORY; IN-SITU; IONS IMPLANTATION; K FACTOR; LOW GRADE; MICRO TEXTURE; MICROMETER SCALE; NON DESTRUCTIVE; PHYLLOSILICATE; REDEPOSITION; SAMPLE PREPARATION; SPATIAL CONTROL; SPATIAL RESOLUTION; TEM-EDX; THERMOBAROMETRY; THIN SECTION; TRANSMISSION ELECTRON MICROSCOPE; ULTRA-THIN; X-RAY ENERGY DISPERSIVE SPECTROMETERS;

CLAY MINERALS; FOCUSED ION BEAMS; IMAGE RESOLUTION; MICA; MILLING (MACHINING); TRANSMISSION ELECTRON MICROSCOPY;

SILICATES;

CLAY MINERAL; PHYLLOSILICATE; QUANTITATIVE ANALYSIS; SAMPLE PREPARATION; SPATIAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84860230635     PISSN: 01691317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.clay.2012.02.010     Document Type: Article

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