The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector

Ultramicroscopy

Volumn 116, Issue , 2012, Pages 73-76

  Frabboni, Stefano ^a,b   Gabrielli, Alessandro ^c,d   Carlo Gazzadi, Gian ^b   Giorgi, Filippo ^c,d   Matteucci, Giorgio ^c   Pozzi, Giulio ^c   Cesari, Nicola Semprini ^c,d   Villa, Mauro ^c,d   Zoccoli, Antonio ^c,d  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^b CNR   (Italy)

^c UNIVERSITY OF BOLOGNA   (Italy)

^d INFN SEZIONE DI BOLOGNA   (Italy)

Author keywords

Coherence in electron scattering; Foundations of quantum mechanics; Matter waves; Measurement theory; Microelectronics

Indexed keywords

ARRIVAL-TIME DISTRIBUTIONS; CMOS CHIPS; FAST READOUT; FOCUSED ION BEAM TECHNIQUE; FRAMES PER SECONDS; INTERFERENCE PATTERNS; MATTER WAVES; NANOSLITS; PIXEL DETECTOR; RECORDING SYSTEMS; SINGLE ELECTRON; THICK SAMPLES; TIME INTERVAL; TRANSMISSION ELECTRON MICROSCOPE;

EXPERIMENTS; MEASUREMENT THEORY; MICROELECTRONICS; QUANTUM THEORY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

ANALYTIC METHOD; ARTICLE; ELECTRON CAPTURE DETECTION; ELECTRON TRANSPORT; EQUIPMENT DESIGN; EXPERIMENTAL STUDY; LABORATORY DEVICE; NANOFABRICATION; PHASE CONTRAST MICROSCOPY; PROCESS OPTIMIZATION; QUANTUM MECHANICS; RADIATION BEAM; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84860116624     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.03.017     Document Type: Article

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