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Applied Physics Letters

Volumn 93, Issue 7, 2008, Pages

Nanofabrication and the realization of Feynman's two-slit experiment

(3) Frabboni, Stefano a,b Gazzadi, Gian Carlo b Pozzi, Giulio c

a UNIVERSITY OF MODENA AND REGGIO EMILIA (Italy)

b CNR Consiglio Nazionale delle Ricerche (Italy)

c UNIVERSITY OF BOLOGNA (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM PLASMA INTERACTIONS; ION BEAMS; ION BOMBARDMENT; QUANTUM THEORY; SPEED; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON INTERFERENCE FRINGES; EXPERIMENTAL EVIDENCE; FOCUSED ION BEAM MILLING; FOCUSED-ION-BEAM-INDUCED DEPOSITION; NANO-FABRICATION; NANO-SIZED; PROBABILITY AMPLITUDE; QUANTUM MECHANICS; STEP-BY-STEP; TRANSMISSION ELECTRON MICROSCOPE;

FOCUSED ION BEAMS;

EID: 50249141669 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2962987 Document Type: Article

Times cited : (51)

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- Considering a brightness B∼ 107 A srcm2, a beam divergence of about 10-6 rad, a current on a unit CCD surface i∼ 105 es, and an electron speed v∼2× 108 ms, it results that the expected mean distance between two electrons into the TEM column is L=vi∼ 103 m.
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