Planar superconducting resonators with internal quality factors above one million

Applied Physics Letters

Volumn 100, Issue 11, 2012, Pages

  Megrant, A ^a,b   Neill, C ^a   Barends, R ^a   Chiaro, B ^a   Chen, Yu ^a   Feigl, L ^b   Kelly, J ^a   Lucero, Erik ^a   Mariantoni, Matteo ^a   O'Malley, P J J ^a   Sank, D ^a   Vainsencher, A ^a   Wenner, J ^a   White, T C ^a   Yin, Y ^a   Zhao, J ^a   Palmstrom C J ^b   Martinis, John M ^a   Cleland, A N ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM METALLIZATION; HIGH MICROWAVE; INTERNAL QUALITY FACTORS; LOW POWER; MEASUREMENT CIRCUIT; MICROWAVE COPLANAR WAVEGUIDES; MICROWAVE RESPONSE; QUALITY FACTORS; SAPPHIRE SUBSTRATES;

COPLANAR WAVEGUIDES; INTERFACES (MATERIALS); PLASMAS; SAPPHIRE;

MICROWAVE RESONATORS;

EID: 84859954410     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3693409     Document Type: Article

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