Research on a new large-scale analog circuit fault diagnosis method

International Journal of Digital Content Technology and its Applications

Volumn 6, Issue 6, 2012, Pages 116-124

  Jingchuan, Lan ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Analog circuit; Fault diagnosis; Large scale circuit; Wavelet analysis

Indexed keywords

CIRCUIT FAULTS; DIAGNOSIS FAULTS; DIAGNOSIS TECHNOLOGY; ELECTRONIC TECHNOLOGIES; FAULT CHARACTERISTICS; LARGE SCALE INTEGRATED CIRCUIT; LARGE-SCALE CIRCUITS; SUB-CIRCUITS; WAVELET ANALYZE;

ANALOG CIRCUITS; DIGITAL COMMUNICATION SYSTEMS; FAILURE ANALYSIS; SOFTWARE ENGINEERING;

WAVELET ANALYSIS;

EID: 84859845314     PISSN: 19759339     EISSN: 22339310     Source Type: Journal    
DOI: 10.4156/jdcta.vol6.issue6.14     Document Type: Article

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