Scanning probe microscopy: Seeing the charge within

Nature Nanotechnology

Volumn 7, Issue 4, 2012, Pages 210-211

  Grutter, Peter ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY;

SCANNING PROBE MICROSCOPY;

CYANINE DYE; NAPHTHALOCYANINE; UNCLASSIFIED DRUG; NANOPARTICLE;

AB INITIO CALCULATION; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; MOLECULAR IMAGING; PRIORITY JOURNAL; SCANNING PROBE MICROSCOPY; SHORT SURVEY; THEORETICAL MODEL; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; ELECTROMAGNETIC FIELD; METHODOLOGY; NANOTECHNOLOGY; NOTE; STATIC ELECTRICITY;

COMPUTER SIMULATION; ELECTROMAGNETIC FIELDS; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING PROBE; MODELS, CHEMICAL; NANOPARTICLES; NANOTECHNOLOGY; STATIC ELECTRICITY;

EID: 84859610136     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2012.43     Document Type: Short Survey

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