Extraction of the sub-bandgap density-of-states in polymer thin-film transistors with the multi-frequency capacitance-voltage spectroscopy

Applied Physics Letters

Volumn 100, Issue 13, 2012, Pages

  Jang, Jaeman ^a   Kim, Jaehyeong ^a   Bae, Minkyung ^a   Lee, Jaewook ^a   Myong Kim, Dong ^a   Hwan Kim, Dae ^a   Lee, Jiyoul ^b   Lee, Bang Lin ^b   Koo, Bonwon ^b   Wan Jin, Yong ^b  

^a Kookmin University   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE; CAPACITANCE-VOLTAGE SPECTROSCOPY; CRYSTALLINITIES; DENSITY-OF-STATES; EXPONENTIAL TAIL; IV CHARACTERISTICS; MULTI FREQUENCY; ORGANIC THIN FILM TRANSISTORS; POLY (3-HEXYLTHIOPHENE); POLYMER SEMICONDUCTORS; SIMULATED RESULTS; TECHNOLOGY COMPUTER AIDED DESIGN; THIN FILM TRANSISTORS (TFT);

COMPUTER AIDED DESIGN; ENERGY GAP; POLYMERIC FILMS; THIN FILM TRANSISTORS; THIOPHENE;

CARRIER MOBILITY;

EID: 84859551820     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3698455     Document Type: Article

References (11)

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