Emissivity measurements with an atomic force microscope

Journal of Applied Physics

Volumn 111, Issue 6, 2012, Pages

  Van Zwol, P J ^a   Ranno, L ^a   Chevrier, J ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); BI-LAYER; BOLTZMANN; FAR-FIELD; FUNCTIONALIZED; IN-VACUUM; MICRO-MECHANICAL; MICRO-SCALES; RADIATIVE HEAT FLUXES; RADIATIVE HEAT TRANSFER; SENSITIVE PROBE; TECHNICAL DETAILS; TWO-MATERIALS;

ATOMIC FORCE MICROSCOPY; ELECTROMAGNETIC WAVE EMISSION; PROBES; VACUUM APPLICATIONS;

HEAT FLUX;

EID: 84859549776     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3697673     Document Type: Article

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