Evaluation of the effect of six different paint cross section preparation methods on the performances of Fourier Transformed Infrared microscopy in attenuated total reflection mode

Microchemical Journal

Volumn 103, Issue , 2012, Pages 79-89

  Prati, S ^a   Rosi, F ^c   Sciutto, G ^a   Mazzeo, R ^a   Magrini, D ^b   Sotiropoulou, S ^d   Van Bos, M ^e  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b CNR   (Italy)

^c UNIVERSITY OF PERUGIA   (Italy)

^d The Ormylia Foundation   (Greece)

^e KIKIRPA   (Belgium)

Author keywords

Argon ion milling; Cyclododecane; FTIR microscopy in ATR mode; KBr; Paint cross sections

Indexed keywords

EID: 84859419440     PISSN: 0026265X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microc.2012.01.007     Document Type: Article

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