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Volumn 396, Issue 2, 2010, Pages 899-910

Performance evaluation of mapping and linear imaging FTIR microspectroscopy for the characterisation of paint cross sections

Author keywords

Attenuated total reflection (ATR); Fourier transform infrared (FTIR) microscopy; Linear imaging; Mapping; Painting materials

Indexed keywords

ATTENUATED TOTAL REFLECTION MODES; ATTENUATED TOTAL REFLECTIONS; CHARACTERISATION; CHEMICAL INFORMATION; CROSS SECTION; DATA QUALITY; FOURIER TRANSFORM INFRARED; FOURIER TRANSFORM INFRARED MICROSCOPIES; FTIR MICROSPECTROSCOPY; LINEAR IMAGING; MCT DETECTOR; MID-INFRARED REGIONS; MULTI-ELEMENT; MULTI-ELEMENT DETECTORS; ORGANIC MATERIALS; ORGANIC SUBSTANCES; PERFORMANCE EVALUATION; POTASSIUM BROMIDE; RASTER SCANNING; SPATIAL RESOLUTION; SPECTRAL QUALITY; THIN ORGANIC LAYERS;

EID: 76849113369     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-009-3269-8     Document Type: Conference Paper
Times cited : (53)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.