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Physical Review Letters

Volumn 108, Issue 13, 2012, Pages

Direct measurement of the triplet exciton diffusion length in organic semiconductors

(4) Mikhnenko, Oleksandr V a,b Ruiter, Roald a Blom, Paul W M a,c Loi, Maria Antonietta a

a UNIVERSITY OF GRONINGEN (Netherlands)

b DUTCH POLYMER INSTITUTE DPI (Netherlands)

c HOLST CENTRE (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT MEASUREMENT; EMISSION INTENSITY; EXCITATION POWER DENSITY; MODEL SYSTEM; PENETRATION PROFILES; PHOSPHORESCENT MATERIAL; SAMPLE STRUCTURE; SHARP INTERFACE; SPIN DEGREES; TRIPLET EXCITONS; TRIPLET-TRIPLET ANNIHILATION;

DIFFUSION; INTERFACES (MATERIALS); NAPHTHALENE; PHOSPHORESCENCE; PRODUCT DEVELOPMENT; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILMS;

EXCITONS;

EID: 84859341196 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.108.137401 Document Type: Article

Times cited : (47)

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