Digital holographic microscopy characterization of superdirective beam by metamaterial

Optics Letters

Volumn 37, Issue 7, 2012, Pages 1142-1144

  Di Caprio, Giuseppe ^a   Dardano, Principia ^a   Coppola, Giuseppe ^a   Cabrini, Stefano ^b   Mocella, Vito ^a  

^a CNR IMM   (Italy)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISPERSIONS; DIGITAL HOLOGRAPHIC MICROSCOPY; EMISSION PROPERTIES; FAR-FIELD REGION; LIGHT BEAM; NEAR FIELD MICROSCOPY; OUT-OF-PLANE; PHASE MAPS;

METAMATERIALS; PHASE MEASUREMENT;

MICROSCOPIC EXAMINATION;

EID: 84859179119     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.001142     Document Type: Article

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