Characterization of ion profiles in light-emitting electrochemical cells by secondary ion mass spectrometry

ACS Applied Materials and Interfaces

Volumn 4, Issue 3, 2012, Pages 1149-1153

  Toshner, Samuel B ^a   Zhu, Zihua ^b   Kosilkin, Ilya V ^c   Leger, Janelle M ^a  

^a WESTERN WASHINGTON UNIVERSITY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF WASHINGTON   (United States)

Author keywords

conjugated polymers; electrochemical doping; organic electronics; polymer light emitting electrochemical cell (LEC); secondary ion beam mass spectrometry

Indexed keywords

ELECTRIC FIELD PROFILES; ELECTROCHEMICAL DOPING; ION DISTRIBUTIONS; ION PROFILES; ION REDISTRIBUTION; JUNCTION DEVICES; LIGHT-EMITTING ELECTROCHEMICAL CELL; ORGANIC ELECTRONICS; POLYMER LIGHT-EMITTING ELECTROCHEMICAL CELL (LEC); POLYMER LIGHT-EMITTING ELECTROCHEMICAL CELLS; SECONDARY IONS;

CONJUGATED POLYMERS; ELECTRIC FIELDS; IONS; SECONDARY ION MASS SPECTROMETRY;

ELECTROCHEMICAL CELLS;

EID: 84859134503     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am201469t     Document Type: Article

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