An indirect impedance characterization method for monolithic THz antennas using coplanar probe measurements

IEEE Antennas and Wireless Propagation Letters

Volumn 11, Issue , 2012, Pages 3-5

  Topalli, Kagan ^a   Trichopoulos, Georgios C ^a   Sertel, Kubilay ^a  

^a The Ohio State University   (United States)

Author keywords

Antenna measurements; focal plane arrays (FPAs); terahertz imaging; THz antennas

Indexed keywords

ANTENNA IMPEDANCE; ANTENNA MEASUREMENT; BACKWARD DIODES; CONTACT AREAS; CONTACT PROBES; ELECTRONIC DEVICE; FOCAL PLANE; IMPEDANCE CHARACTERIZATION; MEASURED DATA; PLANAR ANTENNAS; PROBE MEASUREMENTS; REMOTE LOCATION; RESISTIVE LOADS; SCHOTTKY JUNCTIONS; SENSING APPLICATIONS; TERAHERTZ IMAGING; THZ ANTENNA; ULTRA-FAST;

CHARACTERIZATION; PROBES;

ANTENNAS;

EID: 84859039979     PISSN: 15361225     EISSN: None     Source Type: Journal    
DOI: 10.1109/LAWP.2011.2180885     Document Type: Article

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