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Volumn , Issue , 2006, Pages 1931-1934

On-wafer vEctor network analyzer measurements in the 220-325 GHz frequency band

Author keywords

Coplanar transmission lines; Coplanar waveguides; Measurement; MMIC Amplifiers

Indexed keywords

COPLANAR WAVEGUIDES; FREQUENCY BANDS; HIGH ELECTRON MOBILITY TRANSISTORS; INDIUM PHOSPHIDE; MICROWAVE AMPLIFIERS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 33847771841     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2006.249811     Document Type: Conference Paper
Times cited : (29)

References (9)
  • 2
    • 85136823342 scopus 로고    scopus 로고
    • On-Wafer Testing of Circuits Through 220 GHz
    • Ultrafasl Optics and Electronics Conference, Snowmass, CO, April
    • T. Gaier, L. Samoska, C. Oleson, G. Boll, "On-Wafer Testing of Circuits Through 220 GHz," Ultrafasl Optics and Electronics Conference, Snowmass, CO, April, 1999. OSA Trends in Optics and Photonics Series Vol. 28, pp. 20-26.
    • (1999) OSA Trends in Optics and Photonics Series , vol.28 , pp. 20-26
    • Gaier, T.1    Samoska, L.2    Oleson, C.3    Boll, G.4
  • 8
    • 20844433843 scopus 로고    scopus 로고
    • Experimental Demonstration of Pseudomorphic Heteroj unction Bipolar Transistors with Cutoff Frequencies Above 600 GHz
    • 152101-3, April
    • W. Hafez and M. Feng, "Experimental Demonstration of Pseudomorphic Heteroj unction Bipolar Transistors with Cutoff Frequencies Above 600 GHz," Applied Physics Letters, vol. 86, no. 15, pp. 152101-1 - 152101-3, April. 2005.
    • (2005) Applied Physics Letters , vol.86 , Issue.15 , pp. 152101-152101
    • Hafez, W.1    Feng, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.