On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations

2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010

Volumn , Issue , 2010, Pages 71-74

  Song, Bo ^a   Xi, Ning ^a   Yang, Ruiguo ^a   Lai, King Wai Chiu ^a   Qu, Chengeng ^a  

^a Michigan State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM TIP; CUTTING DEPTH; CUTTING FORCES; HARDWARE DEVELOPMENT; LOCAL SURFACES; NANO SCALE; SAMPLE SURFACE; SINGLE-MOLECULE IMAGING; SURFACE CHANGES; VISUAL FEEDBACK;

NANOLITHOGRAPHY; SURFACE TOPOGRAPHY; SURFACES; VISUAL COMMUNICATION;

ATOMIC FORCE MICROSCOPY;

EID: 78751555868     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NMDC.2010.5651906     Document Type: Conference Paper

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