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Volumn 2, Issue , 2012, Pages 22-25
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XRD, optical and AFM studies on pristine and partially iodized Ag thin film
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Author keywords
Ag thin films; Iodization; SPR
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Indexed keywords
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EID: 84858737083
PISSN: None
EISSN: 22113797
Source Type: Journal
DOI: 10.1016/j.rinp.2012.03.001 Document Type: Article |
Times cited : (16)
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References (25)
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