Iodization of rf sputter induced disordered Ag thin films reveals volume plasmon-exciton "transition"

Journal of Applied Physics

Volumn 100, Issue 6, 2006, Pages

  Bharathi Mohan, D ^a   Sunandana, C S ^a  

^a UNIVERSITY OF HYDERABAD   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EXCITONS; LIGHT ABSORPTION; PHASE TRANSITIONS; SILVER; SPUTTERING; X RAY DIFFRACTION;

FILM THICKNESS; IODIZATION; NANOPARTICLES; PLASMONS;

THIN FILMS;

EID: 33749330743     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2353238     Document Type: Article

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