Simultaneous phase shifting interferometry based in a Mach Zehnder interferometer for measurement of transparent samples

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8011, Issue , 2011, Pages

  Serrano García, David Ignacio ^a   Toto Arellano, Noel Ivan ^a   Martínez García, Amalia ^a   Rayas Álvarez, Juan Antonio ^a   Rodríguez Zurita, Gustavo ^b  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

Author keywords

Diffraction; Interferometry; Phase Object; Phase shifting; Polarization

Indexed keywords

4-F SYSTEM; DIFFRACTION ORDERS; FOURIER PLANES; MACH-ZEHNDER; OPTICAL CONFIGURATIONS; PHASE GRATING; PHASE OBJECT; PHASE SHIFTING INTERFEROMETRY; PHASE-SHIFTING; POLARIZING FILTER; TWO BEAMS;

DIFFRACTION; INTERFEROMETERS; INTERFEROMETRY; PHASE SHIFT; POLARIZATION;

LIGHT;

EID: 84858416022     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.901952     Document Type: Conference Paper

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