Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

Applied Optics

Volumn 38, Issue 28, 1999, Pages 5944-5947

  García, Bernardino Barrientos ^a   Moore, Andrew J ^b   Pérez López, Carlos ^a   Wang, Lingli ^b,c   Tschudi, Theo ^b,c  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b HERIOT WATT UNIVERSITY   (United Kingdom)

^c Inst of Applied Physics   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009546751     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.005944     Document Type: Article

References (13)

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