Phase shifts in the Fourier spectra of phase gratings and phase grids: An application for one-shot phase-shifting interferometry

Optics Express

Volumn 16, Issue 23, 2008, Pages 19330-19341

  Toto Arellano, Noel Ivan ^a   Rodriguez Zurita, Gustavo ^a   Meneses Fabian, Cruz ^a   Vazquez Castillo, Jose F ^a  

^a BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; DIFFRACTION GRATINGS; ELECTRON EMISSION; FOURIER ANALYSIS; FOURIER TRANSFORMS; INTERFEROMETERS; INTERFEROMETRY; MODULATION;

BESSEL FUNCTIONS OF THE FIRST KIND; FOURIER COEFFICIENTS; GRATING INTERFEROMETERS; INTERFERENCE PATTERNS; PHASE SHIFTING INTERFEROMETRY; PHASE-SHIFTING INTERFEROMETERS; REAL-VALUED FUNCTIONS; SINUSOIDAL GRATING;

PHASE SHIFT;

ARTICLE; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; INFRARED SPECTROSCOPY; INSTRUMENTATION; INTERFEROMETRY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTROSCOPY, FOURIER TRANSFORM INFRARED;

EID: 56149095177     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.019330     Document Type: Article

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